Author:
Shashoa Nasar Aldian Ambark,Saheri Weiam Ali,Arwin Munya Ali,Jleta Ibrahim N.
Cited by
2 articles.
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1. A Naive Bayes Classifier for Fault Detection and Classification Using Dimension Reduction Technique;2024 5th International Conference in Electronic Engineering, Information Technology & Education (EEITE);2024-05-29
2. Estimated Parameters Of Auto Regressive eXogenous Model Using Two Stage Least Square and Recursive Least Square Algorithm;2023 IEEE 3rd International Maghreb Meeting of the Conference on Sciences and Techniques of Automatic Control and Computer Engineering (MI-STA);2023-05-21