Author:
Ruat M.,Angers R.,Pakfar A.,Ghibaudo G.,Chantre A.,Revil N.,Pananakakis G.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Reliability Simulation Models for Hot Carrier Degradation;Hot Carrier Degradation in Semiconductor Devices;2014-10-04
2. Coupled Approach for Reliability Study of Fully Self Aligned SiGe: C 250GHz HBTs;2008 IEEE International Integrated Reliability Workshop Final Report;2008-10