Author:
Ma Yingrui,Towey Dave,Yueh Chen Tsong,Quan Zhou Zhi
Cited by
3 articles.
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1. Metamorphic Testing For Machine Learning: Applicability, Challenges, and Research Opportunities;2023 IEEE International Conference On Artificial Intelligence Testing (AITest);2023-07
2. A Classification Study on Testing and Verification of AI-based Systems;2023 IEEE International Conference On Artificial Intelligence Testing (AITest);2023-07
3. Exploring Metamorphic Testing for Fake-News Detection Software: A Case Study;2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC);2023-06