Performance Enhancement of High-Current-Injected Electrically Programmable Fuse With Compressive-Stress Nitride Layer-Reference-Cited by-同舟云学术

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Performance Enhancement of High-Current-Injected Electrically Programmable Fuse With Compressive-Stress Nitride Layer

Published:2014-03 Issue:3 Volume:35 Page:297-299
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Wong Chang-Chien,Chang Sheng-Po,Tu Hwai-Fu,Tseng Ching-Hsiang,Chen Wei-Shou,Chang Shoou-Jinn

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/6746036/06720128.pdf?arnumber=6720128

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quadruple-active-bridge based unified power quality conditioner-L with fault current limiting capability;Electric Power Systems Research;2022-05

2. Quadruple-Active-Bridge Based Unified Power Quality Conditioner-L with Fault Current Limiting Capability;SSRN Electronic Journal;2021

3. Performance Enhancement of Electrically Programmable Fuse with Stress Buffer Oxide Layer;Nanoscience and Nanotechnology Letters;2018-10-01

4. Communication—Diffusion Break-Assisted Programming Mode for Active Electrically Programmable Fuse;ECS Journal of Solid State Science and Technology;2018

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