One-Port Calibration Methods Applicable to Free-Space Material Measurement
Author:
Affiliation:
1. Safety Measurement Institute Korea Research Institute of Standards and Science (KRISS),Daejeon,Republic of Korea,34113
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9998573/9998575/09998744.pdf?arnumber=9998744
Reference6 articles.
1. Quasioptical Systems
2. Planar Offset Short Applicable to the Calibration of a Free-Space Material Measurement System in W-Band
3. Planar Offset Short Applicable to the Calibration of a Free-Space Material Measurement System in W-Band
4. Advances in microwave error correction techniques;rytting;RF & Microwave Measurement Symposium and Exhibition,1987
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