A Two-Step Parametric Method for Failure Prediction in Hard Disk Drives-Reference-Cited by-同舟云学术

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A Two-Step Parametric Method for Failure Prediction in Hard Disk Drives

Published:2014-02 Issue:1 Volume:10 Page:419-430
ISSN:1551-3203
Container-title:IEEE Transactions on Industrial Informatics
language:
Short-container-title:IEEE Trans. Ind. Inf.

Author:

Wang Yu,Ma Eden W. M.,Chow Tommy W. S.,Tsui Kwok-Leung

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/9424/6683081/06517515.pdf?arnumber=6517515

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