Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7938567/7939058/07939074.pdf?arnumber=7939074
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Computational Storage for 3D NAND Flash Error Recovery Flow Prediction;Lecture Notes in Electrical Engineering;2023-11-29
2. Accurate SPICE Model for Cells With Tube-Type Poly-Si Channel in Cell Strings of Vertical NAND Flash Memory;IEEE Transactions on Electron Devices;2023-10
3. Integrated Progressive Built-In Self-Repair (IPBISR) Techniques for NAND Flash Memory;2023 IEEE International Test Conference in Asia (ITC-Asia);2023-09-12
4. E3C Techniques for Protecting NAND Flash Memories;Journal of Electronic Testing;2023-07-01
5. Enhancement of ISPP Efficiency Using Neural Network-Based Optimization of 3-D NAND Cell;IEEE Transactions on Electron Devices;2023-07
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