Author:
Banerjee K.,Amerasekera A.,Chenming Hu
Cited by
24 articles.
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1. ESD Induced Irreversible Degradation Processes in the Semiconductor Devices;2024 6th International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE);2024-02-29
2. ESD
Events and Protection Circuits;The ESD Handbook;2021-03-26
3. Characterization of NMOS-based ESD Protection for Wide-range Pulse Immunity;2021 IEEE International Reliability Physics Symposium (IRPS);2021-03
4. VO2 Switch for Electrostatic Discharge Protection;IEEE Electron Device Letters;2020-02
5. ESD Behavior of MWCNT Interconnects—Part II: Unique Current Conduction Mechanism;IEEE Transactions on Device and Materials Reliability;2017-12