Significant Reduction of Common-Mode Noise in Weakly Coupled Differential Serpentine Delay Microstrip Lines Using Different- Layer-Routing-Turned Traces-Reference-Cited by-同舟云学术

Significant Reduction of Common-Mode Noise in Weakly Coupled Differential Serpentine Delay Microstrip Lines Using Different- Layer-Routing-Turned Traces

Published:2014-10 Issue:10 Volume:4 Page:1671-1683
ISSN:2156-3950
Container-title:IEEE Transactions on Components, Packaging and Manufacturing Technology
language:
Short-container-title:IEEE Trans. Compon., Packag. Manufact. Technol.

Author:

Shiue Guang-Hwa,Yeh Chi-Lou,Liao Huan Yi,Huang Pei-Wei

Funder

National Science Council of Taiwan

College of Electrical Engineering and Computer Science, Chung Yuan Christian University, Taoyuan, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/5503870/6914633/06894136.pdf?arnumber=6894136

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