On Angular Sampling Intervals for Reconstructing Wideband Channel Spatial Profiles in Directional Scanning Measurements-Reference-Cited by-同舟云学术

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On Angular Sampling Intervals for Reconstructing Wideband Channel Spatial Profiles in Directional Scanning Measurements

Published:2020-11 Issue:11 Volume:69 Page:13910-13915
ISSN:0018-9545
Container-title:IEEE Transactions on Vehicular Technology
language:
Short-container-title:IEEE Trans. Veh. Technol.

Author:

Fan Wei^ORCID,Zhang Fengchun^ORCID,Wang Zhengpeng^ORCID,Jensen Ole K.^ORCID,Pedersen Gert F.^ORCID

Funder

Huawei Technologies

Innovationsfonden

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Aerospace Engineering,Automotive Engineering

Link

http://xplorestaging.ieee.org/ielx7/25/9258483/09220813.pdf?arnumber=9220813

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