Ultrahigh Coercivity Magnetic Force Microscopy Probes to Analyze High-Moment Magnetic Structures and Devices-Reference-Cited by-同舟云学术

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Ultrahigh Coercivity Magnetic Force Microscopy Probes to Analyze High-Moment Magnetic Structures and Devices

Published:2010 Issue: Volume:1 Page:6500104-6500104
ISSN:1949-307X
Container-title:IEEE Magnetics Letters
language:
Short-container-title:IEEE Magn. Lett.

Author:

Amos Nissim,Fernandez Robert,Ikkawi Rabee M,Shachar Meir,Jeongmin Hong ,Beomseop Lee ,Litvinov Dmtri,Khizroev Sakhrat

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/5165412/5257438/05497046.pdf?arnumber=5497046

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Creating and detecting a magnetic bimeron by magnetic force microscope probe;Journal of Magnetism and Magnetic Materials;2022-05

2. SmCo-based MFM probes with high switching fields;Journal of Magnetism and Magnetic Materials;2021-02

3. High Coercivity and Resolution FePt•MgO-coated Tip for Imaging the Magnetic Field of Perpendicular Magnetic Write Head by Alternating Magnetic Force Microscopy (A-MFM);Journal of the Magnetics Society of Japan;2019-01-01

4. Ultrasensitive mechanical detection of magnetic moment using a commercial disk drive write head;Nature Communications;2016-09-20

5. Effect of horizontal magnetization reversal of the tips on magnetic force microscopy images;Ultramicroscopy;2014-01

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