Optimal Machine Learning Model for the Relationship Between Grain Size, Channel Thickness, and Grain Boundary Trap Density in 3D NAND Strings-Reference-Cited by-同舟云学术

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Optimal Machine Learning Model for the Relationship Between Grain Size, Channel Thickness, and Grain Boundary Trap Density in 3D NAND Strings

Published:2023-08-26 Issue: Volume: Page:1-6
ISSN:
Container-title:2023 International Conference on Electrical, Electronics, Communication and Computers (ELEXCOM)
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Author:

Verma Dikendra¹,Bhatt Upendra Mohan²,Vidyarthi Anurag²

Affiliation:

1. Graphic Era Hill University, Research Scholar Graphic Era Deemed to be University,Dehradun,India

2. Graphic Era Deemed to be University,Dehradun,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10370004/10370033/10370202.pdf?arnumber=10370202

Reference32 articles.

1. Unsupervised Learning in Winner-Takes-All Neural Network Based on 3D NAND Flash

2. Optimal Program-Read Schemes Towards Highly Reliable Open Block Operations in 3D Charge-trap NAND Flash Memory

3. Channel Thickness and Grain Size Engineering for Improvement of Variability and Performance in 3-D NAND Flash Memory

4. Cell Operation Technologies to Overcome Scale-down Issues in 3D NAND Flash Memory

5. Performance Enhancement by Optimization of Poly Grain Size and Channel Thickness in a Vertical Channel 3-D NAND Flash Memory

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