Isolating First Order Equivalent Mutants via Second Order Mutation-Reference-Cited by-同舟云学术

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Isolating First Order Equivalent Mutants via Second Order Mutation

Published:2012-04 Issue: Volume: Page:
ISSN:
Container-title:2012 IEEE Fifth International Conference on Software Testing, Verification and Validation
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Author:

Kintis Marinos,Papadakis Mike,Malevris Nicos

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6200016/6200080/06200172.pdf?arnumber=6200172

Cited by 34 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Do we need high-order mutation in fault-based Boolean-specification testing?;Journal of Systems and Software;2024-04

2. Do Mutations of Strongly Subsuming Second-Order Mutants Really Mask Each Other?;2023 IEEE 34th International Symposium on Software Reliability Engineering (ISSRE);2023-10-09

3. Improving Fault Localization by Complex-Fault Oriented Higher-Order Mutant Generation;2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC);2023-06

4. Mutation Testing in Evolving Systems: Studying the Relevance of Mutants to Code Evolution;ACM Transactions on Software Engineering and Methodology;2023-01-31

5. GaSubtle: A New Genetic Algorithm for Generating Subtle Higher-Order Mutants;Information;2022-07-07

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