Error Analysis of Nonconstant Admittivity for MR-Based Electric Property Imaging-Reference-Cited by-同舟云学术

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Error Analysis of Nonconstant Admittivity for MR-Based Electric Property Imaging

Published:2012-02 Issue:2 Volume:31 Page:430-437
ISSN:0278-0062
Container-title:IEEE Transactions on Medical Imaging
language:
Short-container-title:IEEE Trans. Med. Imaging

Author:

Jin Keun Seo ,Min-Oh Kim ,Joonsung Lee ,Narae Choi ,Eung Je Woo ,Hyung Joong Kim ,Oh In Kwon ,Dong-Hyun Kim

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Radiological and Ultrasound Technology,Software

Link

http://xplorestaging.ieee.org/ielx5/42/6142636/06036177.pdf?arnumber=6036177

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