Author:
Murphy K.,van Ginneken B.,Reinhardt J. M.,Kabus S.,Kai Ding ,Xiang Deng ,Kunlin Cao ,Kaifang Du ,Christensen G. E.,Garcia V.,Vercauteren T.,Ayache N.,Commowick O.,Malandain G.,Glocker B.,Paragios N.,Navab N.,Gorbunova V.,Sporring J.,de Bruijne M.,Xiao Han ,Heinrich M. P.,Schnabel J. A.,Jenkinson M.,Lorenz C.,Modat M.,McClelland J. R.,Ourselin S.,Muenzing S. E. A.,Viergever M. A.,De Nigris Dante,Collins D. L.,Arbel T.,Peroni M.,Rui Li ,Sharp G. C.,Schmidt-Richberg A.,Ehrhardt J.,Werner R.,Smeets D.,Loeckx D.,Gang Song ,Tustison N.,Avants B.,Gee J. C.,Staring M.,Klein S.,Stoel B. C.,Urschler M.,Werlberger M.,Vandemeulebroucke J.,Rit S.,Sarrut D.,Pluim J. P. W.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Science Applications,Radiological and Ultrasound Technology,Software