Author:
Petrescu Violeta,Pelgrom Marcel,Veendrick Harry,Pavithran Praveen,Wieling Jean
Cited by
6 articles.
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1. Design of Low-Cost Test Structures for Measuring Within-Die Process Skew Variations;2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS);2022-03-21
2. Reference Circuits;Analog-to-Digital Conversion;2021-10-22
3. Reference Circuits;Analog-to-Digital Conversion;2016-09-30
4. FPGA-Based Design of an Intelligent On-Chip Sensor Network Monitoring and Control Using Dynamically Reconfigurable Autonomous Sensor Agents;International Journal of Distributed Sensor Networks;2016-02-01
5. Circuit Solutions;Stochastic Process Variation in Deep-Submicron CMOS;2013-11-14