Competing Causes of Failure and Reliability Tests for Weibull Lifetimes Under Type I Progressive Censoring
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/28639/01282159.pdf?arnumber=1282159
Cited by 36 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Accelerated life test for Pareto distribution under progressive type-II censored competing risks data with binomial removals and its application in electrode insulation system;Communications in Statistics - Simulation and Computation;2023-02-14
2. Bivariate Step-Stress Accelerated Life Tests for the Kavya–Manoharan Exponentiated Weibull Model under Progressive Censoring with Applications;Symmetry;2022-08-29
3. Bayesian and Non-Bayesian Estimation of the Nadaraj ah–Haghighi Distribution: Using Progressive Type-1 Censoring Scheme;Mathematics;2022-02-27
4. Classical and Bayesian Estimation of the Inverse Weibull Distribution: Using Progressive Type-I Censoring Scheme;Advances in Civil Engineering;2021-12-29
5. On a progressively censored competing risks data from Gompertz distribution;Communications in Statistics - Simulation and Computation;2021-02-08
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