Confidence intervals for reliability-growth models with small sample-sizes-Reference-Cited by-同舟云学术

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Confidence intervals for reliability-growth models with small sample-sizes

Published:2003-06 Issue:2 Volume:52 Page:257-262
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:en
Short-container-title:IEEE Trans. Rel.

Author:

Quigley J.,Walls L.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx5/24/27259/01211118.pdf?arnumber=1211118

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Grey Duane model for reliability growth prediction under small sample uncertain failure data;Quality Engineering;2024-01-23

2. Sample Size Design of Launch Vehicle based on SPOT and Bayesian Recursive Estimation;2022 41st Chinese Control Conference (CCC);2022-07-25

3. A Bayesian Approach for Modeling Reliability Growth;2020 Annual Reliability and Maintainability Symposium (RAMS);2020-01

4. Emulation of Utility Functions Over a Set of Permutations: Sequencing Reliability Growth Tasks;Technometrics;2018-06-06

5. An improved multi-kernel RVM integrated with CEEMD for high-quality intervals prediction construction and its intelligent modeling application;Chemometrics and Intelligent Laboratory Systems;2017-12

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