Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
10 articles.
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1. Automated Low-Cost SBST Optimization Techniques for Processor Testing;2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID);2021-02
2. Fragmented software‐based self‐test technique for online intermittent fault detection in processors;IET Computers & Digital Techniques;2020-12-13
3. Integrating Online Safety-related Memory Tests in Multicore Real-Time Systems;2020 IEEE Real-Time Systems Symposium (RTSS);2020-12
4. Availability model for self test and repair in fault tolerant FPGA-based systems;Journal of Electronics (China);2014-08
5. Advanced Diagnosis;Proceedings of the The 51st Annual Design Automation Conference on Design Automation Conference - DAC '14;2014