Defect Prediction on Unlabeled Datasets by Using Unsupervised Clustering-Reference-Cited by-同舟云学术

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Defect Prediction on Unlabeled Datasets by Using Unsupervised Clustering

Published:2016-12 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE 18th International Conference on High Performance Computing and Communications; IEEE 14th International Conference on Smart City; IEEE 2nd International Conference on Data Science and Systems (HPCC/SmartCity/DSS)
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Author:

Yang Jun,Qian Hongbing

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7819725/7828341/07828414.pdf?arnumber=7828414

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Exploratory Framework for Intelligent Labelling of Fault Datasets;2022 Human-Centered Cognitive Systems (HCCS);2022-12-17

2. An Unsupervised Software Fault Prediction Approach Using Threshold Derivation;IEEE Transactions on Reliability;2022-06

3. DebtFree: minimizing labeling cost in self-admitted technical debt identification using semi-supervised learning;Empirical Software Engineering;2022-04-06

4. EkmEx - an extended framework for labeling an unlabeled fault dataset;Multimedia Tools and Applications;2022-01-08

5. FRUGAL: Unlocking Semi-Supervised Learning for Software Analytics;2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE);2021-11

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