Parallel Line Type Permeameter for Thick Magnetic Material to Reduce the Error of Demagnetizing Field
Author:
Affiliation:
1. Graduate School of Biomedical Engineering, Tohoku University,Sendai,Japan,980-8579
2. Graduate School of Engineering, Tohoku University,Sendai,Japan,980-8579
3. Tohoku-TMIT Corporation,Sendai,Japan,983-0803
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10576737/10576738/10576841.pdf?arnumber=10576841
Reference9 articles.
1. Semiautomatic permeance tester for thick magnetic films
2. A new permeance meter based on both lumped elements/transmission line theories
3. Automatic measurement of complex dielectric constant and permeability at microwave frequencies
4. Impact of Complex Permeability Measurements Up to Millimeter-Wave Frequency Range
5. Simultaneous Evaluation of Permeability and Permittivity Using a Flexible Microstrip Line-Type Probe up to 67 GHz
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