High-Resolution Flaw Detection using Eddy-Current Probe Array Based on Giant Magnetoresistance Sensors-Reference-Cited by-同舟云学术

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High-Resolution Flaw Detection using Eddy-Current Probe Array Based on Giant Magnetoresistance Sensors

Published:2024-05-05 Issue: Volume: Page:1-2
ISSN:
Container-title:2024 IEEE International Magnetic Conference - Short papers (INTERMAG Short papers)
language:
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Author:

Bui Long-Vu¹,Jeng Jen-Tzong¹,Huang Hua-Chih¹,Nguyen Huu-Thang²,Doan Van-Dong³,Nguyen Truong-Han¹

Affiliation:

1. National Kaohsiung University of Science and Technology,Department of Mechanical Engineering,Kaohsiung,Taiwan,807618

2. Thai Nguyen University of Technology,Faculty of Mechanical Engineering,Thai Nguyen,Vietnam,250000

3. University of Technology and Education, The University of Da Nang,Faculty of Electrical and Electronic Engineering,Da Nang,Vietnam,550000

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10576737/10576738/10576750.pdf?arnumber=10576750

Reference7 articles.

1. Non-Destructive Techniques Based on Eddy Current Testing

2. Review of conventional and advanced non-destructive testing techniques for detection and characterization of small-scale defects

3. Surface and Subsurface Eddy-Current Imaging With GMR Sensor

4. Giant Magnetoresistance Sensors: A Review on Structures and Non-Destructive Eddy Current Testing Applications

5. GMR array uniform eddy current probe for defect detection in conductive specimens

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