Method to Extract System-Independent Material Properties From Dual-Energy X-Ray CT-Reference-Cited by-同舟云学术

Method to Extract System-Independent Material Properties From Dual-Energy X-Ray CT

Published:2019-03 Issue:3 Volume:66 Page:674-686
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Champley Kyle M.,Azevedo Stephen G.^ORCID,Seetho Isaac M.,Glenn Steven M.,McMichael Larry D.,Smith Jerel A.,Kallman Jeffrey S.,Brown William D.,Martz Harry E.

Funder

Science and Technology Directorate of the Department of Homeland Security

Science and Technology Directorate

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

https://ieeexplore.ieee.org/ielaam/23/8667398/8638824-aam.pdf

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