Accelerated Degradation Testing With Long-Term Memory Effects-Reference-Cited by-同舟云学术

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Accelerated Degradation Testing With Long-Term Memory Effects

Published:2020-12 Issue:4 Volume:69 Page:1254-1266
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Si Wujun^ORCID,Shao Yunfei^ORCID,Wei Wei

Funder

Kansas NASA EPSCoR Research Infrastructure Development Program

American Chemical Society Petroleum Research Fund

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx7/24/9274445/09119200.pdf?arnumber=9119200

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Deep learning the Hurst parameter of linear fractional processes and assessing its reliability;Quality and Reliability Engineering International;2024-08-21

4. Multivariable degradation modeling and life prediction using multivariate fractional Brownian motion;Reliability Engineering & System Safety;2024-08

5. A novel machine learning-based imputation strategy for missing data in step-stress accelerated degradation test;Heliyon;2024-02

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