Author:
Lin Han-Nien,Ho Tzu-Hao,Huang Yu-Chun,Ko Po-Ning,Huang Jia-Yu,Tsai Yu-Lin,Li Jie-Kuan,Hsiao Huei-Chun,Chang Yen-Tang,Su Chia-Hung,Lin Jeffrey Yen-Ting
Cited by
3 articles.
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1. Influence of Temperature on the EFT Immunity of Multistage Integrated Oscillators;IEEE Transactions on Electromagnetic Compatibility;2023-02
2. Analysis of Capacitive Clamp Effect on Power Charging Cords and Plug with EFT Transient Burst Injection;2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC);2022-09-01
3. Equivalent Circuit for I/O Electrical Fast Transient Testing;2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI);2022-08-01