Exclusive test and its applications to fault diagnosis
Author:
Publisher
IEEE Comput. Soc
Link
http://xplorestaging.ieee.org/ielx5/8427/26547/01183128.pdf?arnumber=1183128
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Efficient Diagnosis-Aware ATPG Procedure to Enhance Diagnosis Resolution and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-09
2. Deterministic and Probabilistic Diagnostic Challenge Generation for Arbiter Physical Unclonable Function;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-12
3. COMEDI: Combinatorial Election of Diagnostic Vectors From Detection Test Sets for Logic Circuits;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-04
4. Small Test Set Generation with High Diagnosability;Journal of Circuits, Systems and Computers;2016-02-02
5. An Efficient Diagnosis Pattern Generation Procedure to Distinguish Stuck-at Faults and Bridging Faults;2014 IEEE 23rd Asian Test Symposium;2014-11
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