Learning Second Order Local Anomaly for General Face Forgery Detection-Reference-Cited by-同舟云学术

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Learning Second Order Local Anomaly for General Face Forgery Detection

Published:2022-06 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
language:
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Author:

Fei Jianwei¹,Dai Yunshu¹,Yu Peipeng²,Shen Tianrun³,Xia Zhihua²,Weng Jian²

Affiliation:

1. Nanjing University of Information Science and Technology

2. Jinan University

3. Nanjing University

Funder

National Key Research and Development Plan of China

National Natural Science Foundation of China

Qinglan Project of Jiangsu Province, and “333” project of Jiangsu Province

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9878378/9878366/09880197.pdf?arnumber=9880197

Cited by 31 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Face Omron Ring: Proactive defense against face forgery with identity awareness;Neural Networks;2024-12

2. Local artifacts amplification for deepfakes augmentation;Neural Networks;2024-12

3. Artifact feature purification for cross-domain detection of AI-generated images;Computer Vision and Image Understanding;2024-10

4. Towards Unified Defense for Face Forgery and Spoofing Attacks via Dual Space Reconstruction Learning;International Journal of Computer Vision;2024-07-02

5. Fully Unsupervised Deepfake Video Detection Via Enhanced Contrastive Learning;IEEE Transactions on Pattern Analysis and Machine Intelligence;2024-07

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