Author:
Byun Ilkwon,Min Dongmoon,Lee Gyu-hyeon,Na Seongmin,Kim Jangwoo
Cited by
28 articles.
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1. Nonlinear behaviors in back-gate effects of FDSOI MOSFETs at cryogenic temperatures;Semiconductor Science and Technology;2024-07-12
2. A Benchmark of Cryo-CMOS Embedded SRAM/DRAMs in 40-nm CMOS;IEEE Journal of Solid-State Circuits;2024-07
3. AIO: An Abstraction for Performance Analysis Across Diverse Accelerator Architectures;2024 ACM/IEEE 51st Annual International Symposium on Computer Architecture (ISCA);2024-06-29
4. MaxK-GNN: Extremely Fast GPU Kernel Design for Accelerating Graph Neural Networks Training;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27
5. Gaussian process-based device model toward a unified current model across room to cryogenic temperatures;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15