Author:
Rahagude Nikhil,Chandrasekar Maheshwar,Hsiao Michael S.
Cited by
2 articles.
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1. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
2. Improving the Diagnosability of Scan Chain Faults Under Transparent-Scan by Observation Points;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-06