Author:
S. Krishna Kumar,Kaundinya S.,Chattopadhyay Santanu
Cited by
2 articles.
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1. Low Power March Memory Test Algorithm for Static Random Access Memories;International Journal of Engineering;2018-02
2. Reducing Test Power for Embedded Memories;2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems;2011-10