Author:
Miyazaki M.,Yoneda T.,Fujiwara H.
Cited by
10 articles.
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1. An Efficient Grouping Algorithm with Build-in-Self-Test for Multiple Memories;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10
2. An Efficient Grouping Method for Large-Scale MBIST;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10
3. On Managing Test-Time, Power, and Layer Assignment in 3D SoCs with Built-In-Self-Repair Modules;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
4. 3D IC Memory BIST Controller Allocation for Test Time Minimization Under Power Constraints;2017 IEEE 26th Asian Test Symposium (ATS);2017-11
5. Optimized Built-In Self-Repair for Multiple Memories;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2015