Author:
Heidel D.F.,Bapst U.H.,Jenkins K.A.,Geppert L.M.,Zabel T.H.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Application of SEU imaging for analysis of device architecture using a 25 MeV/u 86 Kr ion microbeam at HIRFL;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08
2. Microbeam studies of single-event effects;IEEE Transactions on Nuclear Science;1996-04
3. IBM experiments in soft fails in computer electronics (1978–1994);IBM Journal of Research and Development;1996-01