Automated Marking System for Short Answer examination (AMS-SAE)
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5343620/5356402/05356500.pdf?arnumber=5356500
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Paraphrase Generation and Supervised Learning for Improved Automatic Short Answer Grading;International Journal of Artificial Intelligence in Education;2024-01-26
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3. Subjective Examination Evaluation Based on Spelling Correction and Detection Using Hamming Distance Algorithm;Communications in Computer and Information Science;2022
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5. Administration by algorithm: A risk management framework;Information Polity;2020-12-04
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