Power quality analysis of Residual Current Device [RCD] nuisance tripping at commercial buildings
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/6729742/6738948/06738980.pdf?arnumber=6738980
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Electric shock feature extraction method based on adaptive variational mode decomposition and singular value decomposition;IET Science, Measurement & Technology;2023-09-14
2. Parasitic Capacitive Couplings in Medium Voltage Power Electronic Systems: An Overview;IEEE Transactions on Power Electronics;2023-08
3. Characteristic leakage current of household devices and their impact on the tripping behaviour of residual current devices;Electric Power Systems Research;2023-01
4. Modelling Neutral to Ground Voltage (NTGV) on the Educational Building;2022 IEEE International Conference in Power Engineering Application (ICPEA);2022-03-07
5. A Study on Residual Current Device Nuisance Tripping Due to Grounding Resistance Value;Lecture Notes in Electrical Engineering;2020
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