Single-Exposure Optical Measurement of Highly Reflective Surfaces via Deep Sinusoidal Prior for Complex Equipment Production-Reference-Cited by-同舟云学术

Single-Exposure Optical Measurement of Highly Reflective Surfaces via Deep Sinusoidal Prior for Complex Equipment Production

Author:

Zhang Jing¹^ORCID,Luo Bin¹^ORCID,Li Fuqian²^ORCID,Niu Xingman²^ORCID,Zhang Qican²,Wang Yajun²^ORCID,Chen Xiangcheng³^ORCID

Affiliation:

1. State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China

2. College of Electronics and Information Engineering, Sichuan University, Chengdu, China

3. School of Artificial Intelligence, Anhui University, Hefei, China

Funder

National Key Research and Development Program of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

Reference41 articles.

3. High-quality self-supervised deep image denoising;laine;Proc Adv Neural Inf Process Syst,0

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献