Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network-Reference-Cited by-同舟云学术

Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network

Author:

Tao Xian¹^ORCID,Zhang Dapeng¹^ORCID,Ma Wenzhi¹,Hou Zhanxin²^ORCID,Lu ZhenFeng²^ORCID,Adak Chandranath³^ORCID

Affiliation:

1. Research Center of Precision Sensing and Control, Institute of Automation, Chinese Academy of Sciences, Beijing, China

2. School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China

3. Department of Computer Science, Indian Institute of Information Technology, Lucknow, India

Funder

Beijing Municipal Natural Science Foundation of China

National Natural Science Foundation of China

Science Challenge

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

Reference35 articles.

1. Mixed supervision for surface-defect detection: From weakly to fully supervised learning;boži?;Comput Ind,2021

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