Electromagnetic Scattering From 3D Layered Structures With Randomly Rough Interfaces: Analysis With the Small Perturbation Method and the Small Slope Approximation-Reference-Cited by-同舟云学术

Electromagnetic Scattering From 3D Layered Structures With Randomly Rough Interfaces: Analysis With the Small Perturbation Method and the Small Slope Approximation

Published:2014-10 Issue:10 Volume:62 Page:5200-5208
ISSN:0018-926X
Container-title:IEEE Transactions on Antennas and Propagation
language:
Short-container-title:IEEE Trans. Antennas Propagat.

Author:

Afifi Saddek^ORCID,Dusseaux Richard,Berrouk Abla

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8/6915774/06862023.pdf?arnumber=6862023

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1. Universal Statistics for the Three Normalized Stokes Parameters for Multilook Data— Application to Signals Scattered by Layered Structures With Slightly Rough Interfaces;IEEE Transactions on Geoscience and Remote Sensing;2024

2. Scattering from an electric–magnetic anisotropic rough interface;Optics Communications;2023-10

3. The small slope approximation method applied to a two dimensional dielectric-topological insulator material rough interface;Alexandria Engineering Journal;2023-03

4. Statistics of the Stokes Parameters for Multilook Signals Scattered by Layered Structures With Slightly Rough Random Interfaces;IEEE Transactions on Geoscience and Remote Sensing;2023

5. Statistics of the Stokes Parameters for the Signal Scattered by Layered Structures With an Arbitrary Number of Slightly Rough Interfaces;IEEE Transactions on Geoscience and Remote Sensing;2022