PyXEL: An Integrated Environment for the Analysis of Fault Effects in SRAM-Based FPGA Routing

Author:

Bozzoli Ludovica,De Sio Corrado,Sterpone Luca,Bernardeschi Cinzia

Publisher

IEEE

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. PyXEL: Exploring Bitstream Analysis to Assess and Enhance the Robustness of Designs on FPGAs;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03

2. Assessing the Robustness of Real-Time Operating System on Soft Processor against Multiple Bit Upset;Proceedings of the 20th ACM International Conference on Computing Frontiers;2023-05-09

3. Characterization of Interconnect Fault Effects in SRAM-based FPGAs;2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS);2023-05-03

4. Bitstream- Level Interconnect Fault Characterization for SRAM-based FPGAs;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04

5. Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems;Electronics;2022-12-30

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