Author:
Kwang-Ting Cheng ,Krstic A.,Hsi-Chuan Chen
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
25 articles.
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2. An Industrial Case Study of Sticky Path-Delay Faults;26th IEEE VLSI Test Symposium (vts 2008);2008-04
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4. Enhanced Broadside Testing for Improved Transition Fault Coverage;16th Asian Test Symposium (ATS 2007);2007-10
5. Selecting High-Quality Delay Tests for Manufacturing Test and Debug;2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems;2006-10