Accurate Measurement of Sneak Current in ReRAM Crossbar Array with Data Storage Pattern Dependencies-Reference-Cited by-同舟云学术

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Accurate Measurement of Sneak Current in ReRAM Crossbar Array with Data Storage Pattern Dependencies

Published:2019-04 Issue: Volume: Page:
ISSN:
Container-title:2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
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Author:

Shang Yaqi,Ohsawa Takashi

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8792345/8804625/08804668.pdf?arnumber=8804668

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