Improving Silicon Health and Operational Metrics at Each Phase of the Device Lifecycle
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Published:2023-04-17
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Container-title:2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)
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Cited by
2 articles.
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1. Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V;2024 IEEE European Test Symposium (ETS);2024-05-20
2. SLM ISA and Hardware Extensions for RISC-V Processors;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03