12-nm Stable Pre-Amplifier Physical Unclonable Function With Self-Destruct Capability-Reference-Cited by-同舟云学术

12-nm Stable Pre-Amplifier Physical Unclonable Function With Self-Destruct Capability

Published:2023-06 Issue:6 Volume:31 Page:840-850
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Hunt-Schroeder Eric¹^ORCID,Xia Tian²^ORCID

Affiliation:

1. Department of Electrical and Biomedical Engineering, University of Vermont, Burlington, VT, USA

2. University of Vermont, Burlington, VT, USA

Funder

Marvell Semiconductor Central Engineering Business Unit

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/10129243/10049760.pdf?arnumber=10049760

Reference24 articles.

1. On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging

2. A statistical test suite for random and pseudorandom number generators for cryptographic applications

3. Secure and robust error correction for physical unclonable functions

4. Structures and methods for self-destruction of physical unclonable function key;schroeder;Proc GOMACTech Conf,2022

5. 13 fJ/bit probing-resilient 250K PUF array with soft darkbit masking for 1.94% bit-error in 22 nm tri-gate CMOS;satpathy;Proc Eur Solid-State Circuits Conf (ESSCIRC),2014

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1. A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells;Journal of Electronic Testing;2023-09-15

2. Reconfigurable Self-Destructing Pre-Amplifier Physical Unclonable Function;2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS);2023-05-08