Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
3 articles.
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1. Non-Test Cubes for Test Generation Targeting Hard-to-Detect Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-12
2. Test Pattern Generation of VLSI Circuits Using Hopfield Neural Networks;Applied Mechanics and Materials;2010-08
3. Models for Delay Faults;Models in Hardware Testing;2009-10-27