New Analytic Model of Coupling and Substrate Capacitance in Nanometer Technologies-Reference-Cited by-同舟云学术

New Analytic Model of Coupling and Substrate Capacitance in Nanometer Technologies

Published:2015-07 Issue:7 Volume:23 Page:1268-1280
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Shomalnasab Gholamreza,Zhang Lihong

Funder

Natural Science and Engineering Research Council of Canada

Canada Foundation for Innovation

Research and Development Corporation of Newfoundland and Labrador through the Industrial Research and Innovation Foundation, Ocean Industries Student Research Award, and Arctic Technology Research and Development Award

Memorial University of Newfoundland, St. John’s, NL, Canada

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/7131599/06860303.pdf?arnumber=6860303

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