Diagnosis and Synthesis for Defective Reconfigurable Single-Electron Transistor Arrays-Reference-Cited by-同舟云学术

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Diagnosis and Synthesis for Defective Reconfigurable Single-Electron Transistor Arrays

Published:2016 Issue: Volume: Page:1-14
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Huang Ching-Yi,Li Yun-Jui,Liu Chian-Wei,Wang Chun-Yao,Chen Yung-Chih,Datta Suman,Narayanan Vijaykrishnan

Funder

Ministry of Science and Technology Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/4359553/7373670.pdf?arnumber=7373670

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Diagnosis for Reconfigurable Single-Electron Transistor Arrays with a More Generalized Defect Model;ACM Journal on Emerging Technologies in Computing Systems;2021-04-30

2. VTR 8;ACM Transactions on Reconfigurable Technology and Systems;2020-06-30

3. Dynamic Diagnosis for Defective Reconfigurable Single-Electron Transistor Arrays;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-04

4. Automatic verification of single‐electron transistor arrays based on multiway decision graphs;IET Circuits, Devices & Systems;2017-01-23

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