Author:
Zhang Minjin,Li Huawei,Li Xiaowei
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
6 articles.
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1. Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation;Journal of Electronic Testing;2023-04
2. Test Generation Algorithms for Crosstalk Faults;Test Generation of Crosstalk Delay Faults in VLSI Circuits;2018-09-21
3. Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2017
4. Automatic Test Pattern Generation;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
5. An ATPG Flow to Generate Crosstalk-Aware Path Delay Pattern;2015 IEEE Computer Society Annual Symposium on VLSI;2015-07