Fine-Grained Fast Field-Programmable Gate Array Scrubbing-Reference-Cited by-同舟云学术

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Fine-Grained Fast Field-Programmable Gate Array Scrubbing

Published:2015-05 Issue:5 Volume:23 Page:893-904
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Nazar Gabriel Luca,Santos Leonardo Pereira,Carro Luigi

Funder

Brazilian Conselho Nacional de Desenvolvimento Científico e Tecnológico

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/7091984/06847718.pdf?arnumber=6847718

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Recent advances on reliability of FPGAs in a radiation environment;Microelectronics Journal;2024-06

2. Criticality-Aware Negotiation-Driven Scrubbing Scheduling for Reliability Maximization in SRAM-Based FPGAs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

3. A Survey on Fault-Tolerance Methods for SRAM-Based FPGAs in Radiation Environments;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14

4. MTTR reduction of FPGA scrubbing: Exploring SEU sensitivity;Microprocessors and Microsystems;2023-09

5. Key Technology and Development of Triple Modular Redundancy Tool for FPGA;J ELECTRON INF TECHN;2022

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