A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration
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Published:2019-02
Issue:2
Volume:27
Page:304-315
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ISSN:1063-8210
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Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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language:
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Short-container-title:IEEE Trans. VLSI Syst.
Author:
Laflamme-Mayer NicolasORCID,
Kowarzyk Gilbert,
Blaquiere Yves,
Savaria YvonORCID,
Sawan MohamadORCID
Funder
Natural Sciences and Engineering Research Council of Canada
Fonds de Recherche du Québec - Nature et Technologies
PROMPT
Mitacs
Gestion TechnoCap Inc
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software