Optimal Runtime Algorithm to Improve Fault Tolerance of Bus-Based Reconfigurable Designs
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Published:2020-04
Issue:4
Volume:28
Page:914-925
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ISSN:1063-8210
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Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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language:
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Short-container-title:IEEE Trans. VLSI Syst.
Author:
Garnica OscarORCID,
Lanchares JuanORCID,
Hidalgo Jose IgnacioORCID
Funder
Ministerio de Ciencia e Innovación
European Regional Development Fund
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software