Characterizations of Distributions Through Aging Intensity
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/24/8370165/08340853.pdf?arnumber=8340853
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4. Nonparametric estimation of aging intensity function for right-censored dependent data;Journal of Statistical Computation and Simulation;2024-01-22
5. Bayesian analysis of accelerated life test under constrained randomization;Quality Engineering;2023-09-18
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